BibTeX record conf/vts/BubnaRG12

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@inproceedings{DBLP:conf/vts/BubnaRG12,
  author    = {Mayur Bubna and
               Kaushik Roy and
               Ashish Goel},
  title     = {{HBIST:} An approach towards zero external test cost},
  booktitle = {30th {IEEE} {VLSI} Test Symposium, {VTS} 2012, Maui, Hawaii, USA,
               23-26 April 2012},
  pages     = {13--18},
  publisher = {{IEEE} Computer Society},
  year      = {2012},
  url       = {https://doi.org/10.1109/VTS.2012.6231073},
  doi       = {10.1109/VTS.2012.6231073},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/conf/vts/BubnaRG12.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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