BibTeX record conf/vts/AkkoucheMS10

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@inproceedings{DBLP:conf/vts/AkkoucheMS10,
  author       = {Nourredine Akkouche and
                  Salvador Mir and
                  Emmanuel Simeu},
  title        = {Ordering of analog specification tests based on parametric defect
                  level estimation},
  booktitle    = {28th {IEEE} {VLSI} Test Symposium, {VTS} 2010, April 19-22, 2010,
                  Santa Cruz, California, {USA}},
  pages        = {301--306},
  publisher    = {{IEEE} Computer Society},
  year         = {2010},
  url          = {https://doi.org/10.1109/VTS.2010.5469546},
  doi          = {10.1109/VTS.2010.5469546},
  timestamp    = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl       = {https://dblp.org/rec/conf/vts/AkkoucheMS10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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