BibTeX record conf/vts/AgboTHKWRC15

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@inproceedings{DBLP:conf/vts/AgboTHKWRC15,
  author    = {Innocent Agbo and
               Mottaqiallah Taouil and
               Said Hamdioui and
               Halil Kukner and
               Pieter Weckx and
               Praveen Raghavan and
               Francky Catthoor},
  title     = {Integral impact of {BTI} and voltage temperature variation on {SRAM}
               sense amplifier},
  booktitle = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
               27-29, 2015},
  pages     = {1--6},
  year      = {2015},
  crossref  = {DBLP:conf/vts/2015},
  url       = {https://doi.org/10.1109/VTS.2015.7116291},
  doi       = {10.1109/VTS.2015.7116291},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/AgboTHKWRC15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/vts/2015,
  title     = {33rd {IEEE} {VLSI} Test Symposium, {VTS} 2015, Napa, CA, USA, April
               27-29, 2015},
  publisher = {{IEEE} Computer Society},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7104933/proceeding},
  isbn      = {978-1-4799-7597-6},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/vts/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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