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BibTeX record conf/vlsid/MazorBMB07
@inproceedings{DBLP:conf/vlsid/MazorBMB07, author = {Daniel Mazor and Michael L. Bushnell and David J. Mulligan and Richard J. Blaikie}, title = {Fault Models and Device Yield of a Large Population of Room Temperature Operation Single-Electron Transistors}, booktitle = {20th International Conference on {VLSI} Design {(VLSI} Design 2007), Sixth International Conference on Embedded Systems {(ICES} 2007), 6-10 January 2007, Bangalore, India}, pages = {657--664}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/VLSID.2007.183}, doi = {10.1109/VLSID.2007.183}, timestamp = {Fri, 24 Mar 2023 00:04:00 +0100}, biburl = {https://dblp.org/rec/conf/vlsid/MazorBMB07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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