BibTeX record conf/vlsid/DasBOF01

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@inproceedings{DBLP:conf/vlsid/DasBOF01,
  author       = {Debesh Kumar Das and
                  Bhargab B. Bhattacharya and
                  Satoshi Ohtake and
                  Hideo Fujiwara},
  title        = {Testable Design of Sequential Circuits with Improved Fault Efficiency},
  booktitle    = {14th International Conference on {VLSI} Design {(VLSI} Design 2001),
                  3-7 January 2001, Bangalore, India},
  pages        = {128--133},
  publisher    = {{IEEE} Computer Society},
  year         = {2001},
  url          = {https://doi.org/10.1109/ICVD.2001.902651},
  doi          = {10.1109/ICVD.2001.902651},
  timestamp    = {Fri, 24 Mar 2023 00:04:01 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/DasBOF01.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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