BibTeX record conf/vlsid/BaikSK04

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@inproceedings{DBLP:conf/vlsid/BaikSK04,
  author       = {Dong Hyun Baik and
                  Kewal K. Saluja and
                  Seiji Kajihara},
  title        = {Random Access Scan: {A} solution to test power, test data volume and
                  test time},
  booktitle    = {17th International Conference on {VLSI} Design {(VLSI} Design 2004),
                  with the 3rd International Conference on Embedded Systems Design,
                  5-9 January 2004, Mumbai, India},
  pages        = {883--888},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/ICVD.2004.1261042},
  doi          = {10.1109/ICVD.2004.1261042},
  timestamp    = {Fri, 24 Mar 2023 00:04:00 +0100},
  biburl       = {https://dblp.org/rec/conf/vlsid/BaikSK04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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