BibTeX record conf/socc/UzzalZSE16

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@inproceedings{DBLP:conf/socc/UzzalZSE16,
  author       = {Mohammad M. Uzzal and
                  Payman Zarkesh{-}Ha and
                  Paul Szauter and
                  Jeremy S. Edwards},
  editor       = {Karan S. Bhatia and
                  Massimo Alioto and
                  Danella Zhao and
                  Andrew Marshall and
                  Ramalingam Sridhar},
  title        = {Behavioral modeling of drain current of an avalanche {ISFET} near
                  breakdown},
  booktitle    = {29th {IEEE} International System-on-Chip Conference, {SOCC} 2016,
                  Seattle, WA, USA, September 6-9, 2016},
  pages        = {169--173},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/SOCC.2016.7905459},
  doi          = {10.1109/SOCC.2016.7905459},
  timestamp    = {Wed, 16 Oct 2019 14:14:53 +0200},
  biburl       = {https://dblp.org/rec/conf/socc/UzzalZSE16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}