BibTeX record conf/sigmetrics/LeeGKV11

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@inproceedings{DBLP:conf/sigmetrics/LeeGKV11,
  author    = {Myungjin Lee and
               Sharon Goldberg and
               Ramana Rao Kompella and
               George Varghese},
  title     = {Fine-grained latency and loss measurements in the presence of reordering},
  booktitle = {{SIGMETRICS} 2011, Proceedings of the 2011 {ACM} {SIGMETRICS} International
               Conference on Measurement and Modeling of Computer Systems, San Jose,
               CA, USA, 07-11 June 2011 (Co-located with {FCRC} 2011)},
  pages     = {329--340},
  year      = {2011},
  crossref  = {DBLP:conf/sigmetrics/2011},
  url       = {https://doi.org/10.1145/1993744.1993778},
  doi       = {10.1145/1993744.1993778},
  timestamp = {Tue, 06 Nov 2018 11:07:17 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/sigmetrics/LeeGKV11},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/sigmetrics/2011,
  editor    = {Arif Merchant and
               Kimberly Keeton and
               Dan Rubenstein},
  title     = {{SIGMETRICS} 2011, Proceedings of the 2011 {ACM} {SIGMETRICS} International
               Conference on Measurement and Modeling of Computer Systems, San Jose,
               CA, USA, 07-11 June 2011 (Co-located with {FCRC} 2011)},
  publisher = {{ACM}},
  year      = {2011},
  url       = {https://doi.org/10.1145/1993744},
  doi       = {10.1145/1993744},
  isbn      = {978-1-4503-0814-4},
  timestamp = {Tue, 06 Nov 2018 11:07:17 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/sigmetrics/2011},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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