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BibTeX record conf/qrs/XiaoLYH17
@inproceedings{DBLP:conf/qrs/XiaoLYH17, author = {Peng Xiao and Bin Liu and Xiaobo Yan and Fuqun Huang}, title = {How Domain Knowledge Accumulation Influences Software Defects: An Empirical Analysis}, booktitle = {2017 {IEEE} International Conference on Software Quality, Reliability and Security Companion, {QRS-C} 2017, Prague, Czech Republic, July 25-29, 2017}, pages = {24--30}, publisher = {{IEEE}}, year = {2017}, url = {https://doi.org/10.1109/QRS-C.2017.14}, doi = {10.1109/QRS-C.2017.14}, timestamp = {Thu, 14 Oct 2021 10:14:37 +0200}, biburl = {https://dblp.org/rec/conf/qrs/XiaoLYH17.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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