BibTeX record conf/qrs/PoonBHPK17

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@inproceedings{DBLP:conf/qrs/PoonBHPK17,
  author       = {Wai Nam Poon and
                  Kwabena Ebo Bennin and
                  Jianglin Huang and
                  Passakorn Phannachitta and
                  Jacky Wai Keung},
  title        = {Cross-Project Defect Prediction Using a Credibility Theory Based Naive
                  Bayes Classifier},
  booktitle    = {2017 {IEEE} International Conference on Software Quality, Reliability
                  and Security, {QRS} 2017, Prague, Czech Republic, July 25-29, 2017},
  pages        = {434--441},
  publisher    = {{IEEE}},
  year         = {2017},
  url          = {https://doi.org/10.1109/QRS.2017.53},
  doi          = {10.1109/QRS.2017.53},
  timestamp    = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl       = {https://dblp.org/rec/conf/qrs/PoonBHPK17.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}