BibTeX record conf/patmos/NoltsisMRCS17

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@inproceedings{DBLP:conf/patmos/NoltsisMRCS17,
  author    = {Michail Noltsis and
               Eleni Maragkoudaki and
               Dimitrios Rodopoulos and
               Francky Catthoor and
               Dimitrios Soudris},
  title     = {Failure probability of a FinFET-based {SRAM} cell utilizing the most
               probable failure point},
  booktitle = {27th International Symposium on Power and Timing Modeling, Optimization
               and Simulation, {PATMOS} 2017, Thessaloniki, Greece, September 25-27,
               2017},
  pages     = {1--8},
  year      = {2017},
  crossref  = {DBLP:conf/patmos/2017},
  url       = {https://doi.org/10.1109/PATMOS.2017.8106967},
  doi       = {10.1109/PATMOS.2017.8106967},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/patmos/NoltsisMRCS17},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/patmos/2017,
  title     = {27th International Symposium on Power and Timing Modeling, Optimization
               and Simulation, {PATMOS} 2017, Thessaloniki, Greece, September 25-27,
               2017},
  publisher = {{IEEE}},
  year      = {2017},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/8095277/proceeding},
  isbn      = {978-1-5090-6462-5},
  timestamp = {Wed, 16 Oct 2019 14:14:57 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/patmos/2017},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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