BibTeX record conf/nems/GongW15

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@inproceedings{DBLP:conf/nems/GongW15,
  author    = {Xu Gong and
               Fei Wang},
  title     = {Line defect detection on 2D materials with micro four-point probe
               measurement},
  booktitle = {10th {IEEE} International Conference on Nano/Micro Engineered and
               Molecular Systems, {NEMS} 2015, Xi'an, China, April 7-11, 2015},
  pages     = {589--592},
  year      = {2015},
  crossref  = {DBLP:conf/nems/2015},
  url       = {https://doi.org/10.1109/NEMS.2015.7147498},
  doi       = {10.1109/NEMS.2015.7147498},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/nems/GongW15},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/nems/2015,
  title     = {10th {IEEE} International Conference on Nano/Micro Engineered and
               Molecular Systems, {NEMS} 2015, Xi'an, China, April 7-11, 2015},
  publisher = {{IEEE}},
  year      = {2015},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/7132046/proceeding},
  isbn      = {978-1-4673-6695-3},
  timestamp = {Wed, 16 Oct 2019 14:14:49 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/nems/2015},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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