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BibTeX record conf/mtdt/HsuHYW06
@inproceedings{DBLP:conf/mtdt/HsuHYW06, author = {Mu{-}Hsien Hsu and Yu{-}Tsao Hsing and Jen{-}Chieh Yeh and Cheng{-}Wen Wu}, title = {Fault-Pattern Oriented Defect Diagnosis for Flash Memory}, booktitle = {14th {IEEE} International Workshop on Memory Technology, Design, and Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan}, pages = {3--8}, publisher = {{IEEE} Computer Society}, year = {2006}, url = {https://doi.org/10.1109/MTDT.2006.13}, doi = {10.1109/MTDT.2006.13}, timestamp = {Sat, 30 Sep 2023 09:53:42 +0200}, biburl = {https://dblp.org/rec/conf/mtdt/HsuHYW06.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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