BibTeX record conf/mtdt/HsuHYW06

download as .bib file

@inproceedings{DBLP:conf/mtdt/HsuHYW06,
  author       = {Mu{-}Hsien Hsu and
                  Yu{-}Tsao Hsing and
                  Jen{-}Chieh Yeh and
                  Cheng{-}Wen Wu},
  title        = {Fault-Pattern Oriented Defect Diagnosis for Flash Memory},
  booktitle    = {14th {IEEE} International Workshop on Memory Technology, Design, and
                  Testing {(MTDT} 2006), 2-4 August 2006, Taipei, Taiwan},
  pages        = {3--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2006},
  url          = {https://doi.org/10.1109/MTDT.2006.13},
  doi          = {10.1109/MTDT.2006.13},
  timestamp    = {Sat, 30 Sep 2023 09:53:42 +0200},
  biburl       = {https://dblp.org/rec/conf/mtdt/HsuHYW06.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics