BibTeX record conf/itqm/YunJP18

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@inproceedings{DBLP:conf/itqm/YunJP18,
  author       = {Gyungsik Yun and
                  Hee{-}Won Jung and
                  Sungbum Park},
  editor       = {Yong Shi and
                  Peter Wolcott and
                  Wikil Kwak and
                  Zhengxin Chen and
                  Yingjie Tian and
                  Heeseok Lee},
  title        = {Prediction of Field Failure Rate using Data Mining in the Automotive
                  Semiconductor},
  booktitle    = {Proceedings of the 6th International Conference on Information Technology
                  and Quantitative Management, {ITQM} 2018, Advanced Information Technology
                  and Global Business Competition, October 20-21, 2018, Omaha, Nebraska,
                  {USA}},
  series       = {Procedia Computer Science},
  volume       = {139},
  pages        = {512--520},
  publisher    = {Elsevier},
  year         = {2018},
  url          = {https://doi.org/10.1016/j.procs.2018.10.242},
  doi          = {10.1016/J.PROCS.2018.10.242},
  timestamp    = {Mon, 08 May 2023 14:38:37 +0200},
  biburl       = {https://dblp.org/rec/conf/itqm/YunJP18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}