BibTeX record conf/itc/YonedaHIF11

• > Home > conf/itc/YonedaHIF11

@inproceedings{DBLP:conf/itc/YonedaHIF11,
  author       = {Tomokazu Yoneda and
                  Keigo Hori and
                  Michiko Inoue and
                  Hideo Fujiwara},
  editor       = {Bill Eklow and
                  R. D. (Shawn) Blanton},
  title        = {Faster-than-at-speed test for increased test quality and in-field
                  reliability},
  booktitle    = {2011 {IEEE} International Test Conference, {ITC} 2011, Anaheim, CA,
                  USA, September 20-22, 2011},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2011},
  url          = {https://doi.org/10.1109/TEST.2011.6139131},
  doi          = {10.1109/TEST.2011.6139131},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/YonedaHIF11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}