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BibTeX record conf/itc/XiangXF00
@inproceedings{DBLP:conf/itc/XiangXF00, author = {Dong Xiang and Yi Xu and Hideo Fujiwara}, title = {Non-scan design for testability for synchronous sequential circuits based on conflict analysis}, booktitle = {Proceedings {IEEE} International Test Conference 2000, Atlantic City, NJ, USA, October 2000}, pages = {520--529}, publisher = {{IEEE} Computer Society}, year = {2000}, url = {https://doi.org/10.1109/TEST.2000.894245}, doi = {10.1109/TEST.2000.894245}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/XiangXF00.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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