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BibTeX record conf/itc/Wrinn95
@inproceedings{DBLP:conf/itc/Wrinn95, author = {Joe Wrinn}, title = {Two New Techniques for Identifying Opens on Printed Circuit Boards: Analog Junction Test {\&} Radio Frequency Induction Test}, booktitle = {Proceedings {IEEE} International Test Conference 1995, Driving Down the Cost of Test, Washington, DC, USA, October 21-25, 1995}, pages = {927}, publisher = {{IEEE} Computer Society}, year = {1995}, url = {https://doi.org/10.1109/TEST.1995.529936}, doi = {10.1109/TEST.1995.529936}, timestamp = {Thu, 23 Mar 2023 23:58:40 +0100}, biburl = {https://dblp.org/rec/conf/itc/Wrinn95.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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