BibTeX record conf/itc/WenMKSYGOW07

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@inproceedings{DBLP:conf/itc/WenMKSYGOW07,
  author       = {Xiaoqing Wen and
                  Kohei Miyase and
                  Seiji Kajihara and
                  Tatsuya Suzuki and
                  Yuta Yamato and
                  Patrick Girard and
                  Yuji Ohsumi and
                  Laung{-}Terng Wang},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {A novel scheme to reduce power supply noise for high-quality at-speed
                  scan testing},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--10},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437632},
  doi          = {10.1109/TEST.2007.4437632},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/WenMKSYGOW07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}