BibTeX record conf/itc/WenMKSYGOW07

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@inproceedings{DBLP:conf/itc/WenMKSYGOW07,
  author    = {Xiaoqing Wen and
               Kohei Miyase and
               Seiji Kajihara and
               Tatsuya Suzuki and
               Yuta Yamato and
               Patrick Girard and
               Yuji Ohsumi and
               Laung{-}Terng Wang},
  title     = {A novel scheme to reduce power supply noise for high-quality at-speed
               scan testing},
  booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
               California, USA, October 21-26, 2007},
  pages     = {1--10},
  year      = {2007},
  crossref  = {DBLP:conf/itc/2007},
  url       = {https://doi.org/10.1109/TEST.2007.4437632},
  doi       = {10.1109/TEST.2007.4437632},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/WenMKSYGOW07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2007,
  editor    = {Jill Sibert and
               Janusz Rajski},
  title     = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
               California, USA, October 21-26, 2007},
  publisher = {{IEEE} Computer Society},
  year      = {2007},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4437545/proceeding},
  isbn      = {1-4244-1128-9},
  timestamp = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2007},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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