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BibTeX record conf/itc/WeisKSVC91
@inproceedings{DBLP:conf/itc/WeisKSVC91, author = {E. Weis and E. Kinsbron and M. Snyder and B. Vogel and N. Croitoru}, title = {Electromigration Effects in {VLSI} Due to Various Current Types}, booktitle = {Proceedings {IEEE} International Test Conference 1991, Test: Faster, Better, Sooner, Nashville, TN, USA, October 26-30, 1991}, pages = {354--357}, publisher = {{IEEE} Computer Society}, year = {1991}, url = {https://doi.org/10.1109/TEST.1991.519694}, doi = {10.1109/TEST.1991.519694}, timestamp = {Wed, 16 Oct 2019 14:14:52 +0200}, biburl = {https://dblp.org/rec/conf/itc/WeisKSVC91.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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