BibTeX record conf/itc/TsukudeAHKHSF92

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@inproceedings{DBLP:conf/itc/TsukudeAHKHSF92,
  author       = {Masaki Tsukude and
                  Kazutami Arimoto and
                  Hideto Hidaka and
                  Yasuhiro Konishi and
                  Masanori Hayashikoshi and
                  Katsunori Suma and
                  Kazuyasu Fujishima},
  title        = {A Testing Technique for {ULSI} Memory with On-Chip Voltage Down Converter},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {615--622},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527882},
  doi          = {10.1109/TEST.1992.527882},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/TsukudeAHKHSF92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}