BibTeX record conf/itc/TshagharyanHZGG18

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@inproceedings{DBLP:conf/itc/TshagharyanHZGG18,
  author    = {G. Tshagharyan and
               Gurgen Harutyunyan and
               Yervant Zorian and
               Anteneh Gebregiorgis and
               Mohammad Saber Golanbari and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori},
  title     = {Modeling and Testing of Aging Faults in FinFET Memories for Automotive
               Applications},
  booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  pages     = {1--10},
  year      = {2018},
  crossref  = {DBLP:conf/itc/2018},
  url       = {https://doi.org/10.1109/TEST.2018.8624890},
  doi       = {10.1109/TEST.2018.8624890},
  timestamp = {Sat, 26 Jan 2019 17:53:57 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/TshagharyanHZGG18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2018,
  title     = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8610502},
  isbn      = {978-1-5386-8382-8},
  timestamp = {Sat, 26 Jan 2019 17:53:25 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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