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BibTeX record conf/itc/SouefEA08
@inproceedings{DBLP:conf/itc/SouefEA08, author = {Laurent Souef and Christophe Eychenne and Emmanuel Alie}, editor = {Douglas Young and Nur A. Touba}, title = {Architecture for Testing Multi-Voltage Domain {SOC}}, booktitle = {2008 {IEEE} International Test Conference, {ITC} 2008, Santa Clara, California, USA, October 26-31, 2008}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2008}, url = {https://doi.org/10.1109/TEST.2008.4700592}, doi = {10.1109/TEST.2008.4700592}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/SouefEA08.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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