BibTeX record conf/itc/SodenH85

download as .bib file

@inproceedings{DBLP:conf/itc/SodenH85,
  author       = {Jerry M. Soden and
                  Charles F. Hawkins},
  title        = {Electrical Characteristics and Testing Considerations for Gate Oxide
                  Shorts in {CMOS} ICs},
  booktitle    = {Proceedings International Test Conference 1985, Philadelphia, PA,
                  USA, November 1985},
  pages        = {544--557},
  publisher    = {{IEEE} Computer Society},
  year         = {1985},
  timestamp    = {Mon, 11 Nov 2002 15:59:32 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/SodenH85.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
a service of  Schloss Dagstuhl - Leibniz Center for Informatics

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.