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BibTeX record conf/itc/Savir90
@inproceedings{DBLP:conf/itc/Savir90, author = {Jacob Savir}, title = {{AC} product defect level and yield loss}, booktitle = {Proceedings {IEEE} International Test Conference 1990, Washington, D.C., USA, September 10-14, 1990}, pages = {726--738}, publisher = {{IEEE} Computer Society}, year = {1990}, url = {https://doi.org/10.1109/TEST.1990.114089}, doi = {10.1109/TEST.1990.114089}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/Savir90.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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