BibTeX record conf/itc/RyanAHJL14

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@inproceedings{DBLP:conf/itc/RyanAHJL14,
  author       = {Paul G. Ryan and
                  Irfan Aziz and
                  William B. Howell and
                  Teresa K. Janczak and
                  Davia J. Lu},
  title        = {Process defect trends and strategic test gaps},
  booktitle    = {2014 International Test Conference, {ITC} 2014, Seattle, WA, USA,
                  October 20-23, 2014},
  pages        = {1--8},
  publisher    = {{IEEE} Computer Society},
  year         = {2014},
  url          = {https://doi.org/10.1109/TEST.2014.7035276},
  doi          = {10.1109/TEST.2014.7035276},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/RyanAHJL14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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