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BibTeX record conf/itc/PandeyGLNSC19
@inproceedings{DBLP:conf/itc/PandeyGLNSC19, author = {Sujay Pandey and Sanya Gupta and Madhu Sudhan L. and Suriya Natarajan and Arani Sinha and Abhijit Chatterjee}, title = {Characterization of Library Cells for Open-circuit Defect Exposure: {A} Systematic Methodology}, booktitle = {{IEEE} International Test Conference, {ITC} 2019, Washington, DC, USA, November 9-15, 2019}, pages = {1--10}, publisher = {{IEEE}}, year = {2019}, url = {https://doi.org/10.1109/ITC44170.2019.9000154}, doi = {10.1109/ITC44170.2019.9000154}, timestamp = {Mon, 24 Feb 2020 17:28:46 +0100}, biburl = {https://dblp.org/rec/conf/itc/PandeyGLNSC19.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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