BibTeX record conf/itc/NakaoKHIT99

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@inproceedings{DBLP:conf/itc/NakaoKHIT99,
  author       = {Michinobu Nakao and
                  Seiji Kobayashi and
                  Kazumi Hatayama and
                  Kazuhiko Iijima and
                  Seiji Terada},
  title        = {Low overhead test point insertion for scan-based {BIST}},
  booktitle    = {Proceedings {IEEE} International Test Conference 1999, Atlantic City,
                  NJ, USA, 27-30 September 1999},
  pages        = {348--357},
  publisher    = {{IEEE} Computer Society},
  year         = {1999},
  url          = {https://doi.org/10.1109/TEST.1999.805649},
  doi          = {10.1109/TEST.1999.805649},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/NakaoKHIT99.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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