BibTeX record conf/itc/NairBTTGHZ18

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@inproceedings{DBLP:conf/itc/NairBTTGHZ18,
  author    = {Sarath Mohanachandran Nair and
               Rajendra Bishnoi and
               Mehdi Baradaran Tahoori and
               G. Tshagharyan and
               H. Grigoryan and
               Gurgen Harutyunyan and
               Yervant Zorian},
  title     = {Defect injection, Fault Modeling and Test Algorithm Generation Methodology
               for {STT-MRAM}},
  booktitle = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  pages     = {1--10},
  year      = {2018},
  crossref  = {DBLP:conf/itc/2018},
  url       = {https://doi.org/10.1109/TEST.2018.8624725},
  doi       = {10.1109/TEST.2018.8624725},
  timestamp = {Sat, 26 Jan 2019 17:53:57 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/NairBTTGHZ18},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2018,
  title     = {{IEEE} International Test Conference, {ITC} 2018, Phoenix, AZ, USA,
               October 29 - Nov. 1, 2018},
  publisher = {{IEEE}},
  year      = {2018},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=8610502},
  isbn      = {978-1-5386-8382-8},
  timestamp = {Sat, 26 Jan 2019 17:53:25 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2018},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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