BibTeX record conf/itc/MolyneauxZKAHH07

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@inproceedings{DBLP:conf/itc/MolyneauxZKAHH07,
  author    = {Robert F. Molyneaux and
               Thomas A. Ziaja and
               Hong Kim and
               Shahryar Aryani and
               Sungbae Hwang and
               Alex Hsieh},
  title     = {Design for testability features of the {SUN} microsystems niagara2
               {CMP/CMT} {SPARC} chip},
  booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
               California, USA, October 21-26, 2007},
  pages     = {1--8},
  year      = {2007},
  crossref  = {DBLP:conf/itc/2007},
  url       = {https://doi.org/10.1109/TEST.2007.4437561},
  doi       = {10.1109/TEST.2007.4437561},
  timestamp = {Wed, 24 May 2017 08:31:24 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/MolyneauxZKAHH07},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2007,
  editor    = {Jill Sibert and
               Janusz Rajski},
  title     = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
               California, USA, October 21-26, 2007},
  publisher = {{IEEE}},
  year      = {2007},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=4437545},
  isbn      = {1-4244-1128-9},
  timestamp = {Tue, 07 Feb 2012 18:07:12 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2007},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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