BibTeX record conf/itc/MiyamotoMMAYN85

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@inproceedings{DBLP:conf/itc/MiyamotoMMAYN85,
  author       = {Hiroshi Miyamoto and
                  Koichiro Mashiko and
                  Yoshikazu Morooka and
                  Kazutami Arimoto and
                  Michihiro Yamada and
                  T. Nakano},
  title        = {Test Pattern Considerations for Fault Tolerant High Density {DRAM}},
  booktitle    = {Proceedings International Test Conference 1985, Philadelphia, PA,
                  USA, November 1985},
  pages        = {451--455},
  publisher    = {{IEEE} Computer Society},
  year         = {1985},
  timestamp    = {Mon, 11 Nov 2002 15:59:32 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MiyamotoMMAYN85.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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