BibTeX record conf/itc/MetraMO04

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@inproceedings{DBLP:conf/itc/MetraMO04,
  author       = {Cecilia Metra and
                  T. M. Mak and
                  Martin Oma{\~{n}}a},
  title        = {Risks Associated with Faults within Test Pattern Compactors and Their
                  Implications on Testing},
  booktitle    = {Proceedings 2004 International Test Conference {(ITC} 2004), October
                  26-28, 2004, Charlotte, NC, {USA}},
  pages        = {1223--1231},
  publisher    = {{IEEE} Computer Society},
  year         = {2004},
  url          = {https://doi.org/10.1109/TEST.2004.1387395},
  doi          = {10.1109/TEST.2004.1387395},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/MetraMO04.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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