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BibTeX record conf/itc/MaxwellAH94
@inproceedings{DBLP:conf/itc/MaxwellAH94, author = {Peter C. Maxwell and Robert C. Aitken and Leendert M. Huisman}, title = {The Effect on Quality of Non-Uniform Fault Coverage and Fault Probability}, booktitle = {Proceedings {IEEE} International Test Conference 1994, {TEST:} The Next 25 Years, Washington, DC, USA, October 2-6, 1994}, pages = {739--746}, publisher = {{IEEE} Computer Society}, year = {1994}, url = {https://doi.org/10.1109/TEST.1994.528020}, doi = {10.1109/TEST.1994.528020}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/MaxwellAH94.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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