BibTeX record conf/itc/LiJLXC16

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@inproceedings{DBLP:conf/itc/LiJLXC16,
  author    = {Tianjian Li and
               Li Jiang and
               Xiaoyao Liang and
               Qiang Xu and
               Krishnendu Chakrabarty},
  title     = {Defect tolerance for CNFET-based SRAMs},
  booktitle = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
               TX, USA, November 15-17, 2016},
  pages     = {1--9},
  year      = {2016},
  crossref  = {DBLP:conf/itc/2016},
  url       = {https://doi.org/10.1109/TEST.2016.7805833},
  doi       = {10.1109/TEST.2016.7805833},
  timestamp = {Wed, 13 Jun 2018 17:08:27 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/itc/LiJLXC16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/itc/2016,
  title     = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
               TX, USA, November 15-17, 2016},
  publisher = {{IEEE}},
  year      = {2016},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7794484},
  isbn      = {978-1-4673-8773-6},
  timestamp = {Mon, 09 Jan 2017 13:10:14 +0100},
  biburl    = {https://dblp.org/rec/bib/conf/itc/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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