BibTeX record conf/itc/LeeL85

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@inproceedings{DBLP:conf/itc/LeeL85,
  author    = {S. Daniel Lee and
               Lisa Deerr Li},
  title     = {A Comprehensive Approach to Test Program Debugging for High Performance
               {VLSI} Test Systems},
  booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA,
               USA, November 1985},
  pages     = {652--665},
  publisher = {{IEEE} Computer Society},
  year      = {1985},
  timestamp = {Mon, 11 Nov 2002 15:59:32 +0100},
  biburl    = {https://dblp.org/rec/conf/itc/LeeL85.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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