BibTeX record conf/itc/LeaBKC88

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@inproceedings{DBLP:conf/itc/LeaBKC88,
  author       = {Stephen M. Lea and
                  Nigel Brown and
                  Tim Katz and
                  Phil Collins},
  title        = {Expert System for the Functional Test Program Generation of Digital
                  Electronic Circuit Boards},
  booktitle    = {Proceedings International Test Conference 1988, Washington, D.C.,
                  USA, September 1988},
  pages        = {209--220},
  publisher    = {{IEEE} Computer Society},
  year         = {1988},
  url          = {https://doi.org/10.1109/TEST.1988.207805},
  doi          = {10.1109/TEST.1988.207805},
  timestamp    = {Wed, 16 Oct 2019 14:14:52 +0200},
  biburl       = {https://dblp.org/rec/conf/itc/LeaBKC88.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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