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BibTeX record conf/itc/KhursheedZAAK10
@inproceedings{DBLP:conf/itc/KhursheedZAAK10, author = {S. Saqib Khursheed and Shida Zhong and Robert C. Aitken and Bashir M. Al{-}Hashimi and Sandip Kundu}, editor = {Ron Press and Erik H. Volkerink}, title = {Modeling the impact of process variation on resistive bridge defects}, booktitle = {2011 {IEEE} International Test Conference, {ITC} 2010, Austin, TX, USA, November 2-4, 2010}, pages = {295--304}, publisher = {{IEEE} Computer Society}, year = {2010}, url = {https://doi.org/10.1109/TEST.2010.5699230}, doi = {10.1109/TEST.2010.5699230}, timestamp = {Thu, 23 Mar 2023 23:58:41 +0100}, biburl = {https://dblp.org/rec/conf/itc/KhursheedZAAK10.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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