BibTeX record conf/itc/KapurPM92

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@inproceedings{DBLP:conf/itc/KapurPM92,
  author       = {Rohit Kapur and
                  Jaehong Park and
                  M. Ray Mercer},
  title        = {All Tests for a Fault Are Not Equally Valuable for Defect Detection},
  booktitle    = {Proceedings {IEEE} International Test Conference 1992, Discover the
                  New World of Test and Design, Baltimore, Maryland, USA, September
                  20-24, 1992},
  pages        = {762--769},
  publisher    = {{IEEE} Computer Society},
  year         = {1992},
  url          = {https://doi.org/10.1109/TEST.1992.527898},
  doi          = {10.1109/TEST.1992.527898},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KapurPM92.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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