BibTeX record conf/itc/HsuSSLCSC16

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@inproceedings{DBLP:conf/itc/HsuSSLCSC16,
  author       = {Chun{-}Kai Hsu and
                  Peter Sarson and
                  Gregor Schatzberger and
                  Friedrich Peter Leisenberger and
                  John M. Carulli Jr. and
                  Siddhartha Siddhartha and
                  Kwang{-}Ting Cheng},
  title        = {Variation and failure characterization through pattern classification
                  of test data from multiple test stages},
  booktitle    = {2016 {IEEE} International Test Conference, {ITC} 2016, Fort Worth,
                  TX, USA, November 15-17, 2016},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/TEST.2016.7805845},
  doi          = {10.1109/TEST.2016.7805845},
  timestamp    = {Wed, 07 Dec 2022 23:11:40 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/HsuSSLCSC16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}