BibTeX record conf/itc/FranchRNHFDWGS07

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@inproceedings{DBLP:conf/itc/FranchRNHFDWGS07,
  author       = {Robert L. Franch and
                  Phillip J. Restle and
                  James K. Norman and
                  William V. Huott and
                  Joshua Friedrich and
                  R. Dixon and
                  Steve Weitzel and
                  K. van Goor and
                  Gerard Salem},
  editor       = {Jill Sibert and
                  Janusz Rajski},
  title        = {On-chip timing uncertainty measurements on {IBM} microprocessors},
  booktitle    = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara,
                  California, USA, October 21-26, 2007},
  pages        = {1--7},
  publisher    = {{IEEE} Computer Society},
  year         = {2007},
  url          = {https://doi.org/10.1109/TEST.2007.4437560},
  doi          = {10.1109/TEST.2007.4437560},
  timestamp    = {Thu, 23 Mar 2023 23:58:42 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/FranchRNHFDWGS07.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}