BibTeX record conf/itc/BlantonCDDMV02

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@inproceedings{DBLP:conf/itc/BlantonCDDMV02,
  author       = {Ronald D. Blanton and
                  John T. Chen and
                  Rao Desineni and
                  Kumar N. Dwarakanath and
                  Wojciech Maly and
                  Thomas J. Vogels},
  title        = {Fault Tuples in Diagnosis of Deep-Submicron Circuits},
  booktitle    = {Proceedings {IEEE} International Test Conference 2002, Baltimore,
                  MD, USA, October 7-10, 2002},
  pages        = {233--241},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/TEST.2002.1041765},
  doi          = {10.1109/TEST.2002.1041765},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/BlantonCDDMV02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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