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BibTeX record conf/itc/BhuniaR07
@inproceedings{DBLP:conf/itc/BhuniaR07, author = {Swarup Bhunia and Kaushik Roy}, editor = {Jill Sibert and Janusz Rajski}, title = {Power dissipation, variations and nanoscale {CMOS} design: Test challenges and self-calibration/self-repair solutions}, booktitle = {2007 {IEEE} International Test Conference, {ITC} 2007, Santa Clara, California, USA, October 21-26, 2007}, pages = {1--10}, publisher = {{IEEE} Computer Society}, year = {2007}, url = {https://doi.org/10.1109/TEST.2007.4437659}, doi = {10.1109/TEST.2007.4437659}, timestamp = {Tue, 07 May 2024 20:06:46 +0200}, biburl = {https://dblp.org/rec/conf/itc/BhuniaR07.bib}, bibsource = {dblp computer science bibliography, https://dblp.org} }
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