BibTeX record conf/itc/AzumaMUNTMHTY13

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@inproceedings{DBLP:conf/itc/AzumaMUNTMHTY13,
  author       = {Naoya Azuma and
                  T. Makita and
                  S. Ueyama and
                  Makoto Nagata and
                  Satoru Takahashi and
                  Motoki Murakami and
                  Kazuaki Hori and
                  Satoshi Tanaka and
                  Masahiro Yamaguchi},
  title        = {In-system diagnosis of {RF} ICs for tolerance against on-chip in-band
                  interferers},
  booktitle    = {2013 {IEEE} International Test Conference, {ITC} 2013, Anaheim, CA,
                  USA, September 6-13, 2013},
  pages        = {1--9},
  publisher    = {{IEEE} Computer Society},
  year         = {2013},
  url          = {https://doi.org/10.1109/TEST.2013.6651922},
  doi          = {10.1109/TEST.2013.6651922},
  timestamp    = {Thu, 23 Mar 2023 23:58:38 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/AzumaMUNTMHTY13.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}