BibTeX record conf/isvlsi/ShaS08

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@inproceedings{DBLP:conf/isvlsi/ShaS08,
  author    = {Selina Sha and
               Bruce Swanson},
  title     = {A Real Case of Significant Scan Test Cost Reduction},
  booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2008, 7-9
               April 2008, Montpellier, France},
  pages     = {239--244},
  year      = {2008},
  crossref  = {DBLP:conf/isvlsi/2008},
  url       = {https://doi.org/10.1109/ISVLSI.2008.32},
  doi       = {10.1109/ISVLSI.2008.32},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/ShaS08},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isvlsi/2008,
  title     = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2008, 7-9
               April 2008, Montpellier, France},
  publisher = {{IEEE} Computer Society},
  year      = {2008},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/4556750/proceeding},
  isbn      = {978-0-7695-3170-0},
  timestamp = {Wed, 16 Oct 2019 14:14:54 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/2008},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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