BibTeX record conf/isvlsi/AgboTHWCRCD16

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@inproceedings{DBLP:conf/isvlsi/AgboTHWCRCD16,
  author    = {Innocent Agbo and
               Mottaqiallah Taouil and
               Said Hamdioui and
               Pieter Weckx and
               Stefan Cosemans and
               Praveen Raghavan and
               Francky Catthoor and
               Wim Dehaene},
  title     = {Quantification of Sense Amplifier Offset Voltage Degradation due to
               Zero-and Run-Time Variability},
  booktitle = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2016, Pittsburgh,
               PA, USA, July 11-13, 2016},
  pages     = {725--730},
  year      = {2016},
  crossref  = {DBLP:conf/isvlsi/2016},
  url       = {https://doi.org/10.1109/ISVLSI.2016.30},
  doi       = {10.1109/ISVLSI.2016.30},
  timestamp = {Sun, 21 May 2017 00:22:38 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/AgboTHWCRCD16},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isvlsi/2016,
  title     = {{IEEE} Computer Society Annual Symposium on VLSI, {ISVLSI} 2016, Pittsburgh,
               PA, USA, July 11-13, 2016},
  publisher = {{IEEE} Computer Society},
  year      = {2016},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=7558446},
  isbn      = {978-1-4673-9039-2},
  timestamp = {Tue, 20 Sep 2016 12:04:25 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isvlsi/2016},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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