BibTeX record conf/issre/UreshinoNYNA18

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@inproceedings{DBLP:conf/issre/UreshinoNYNA18,
  author       = {Aya Ureshino and
                  Yasuharu Nishi and
                  Satomi Yoshizawa and
                  Makoto Nonaka and
                  Makiko Asai},
  editor       = {Sudipto Ghosh and
                  Roberto Natella and
                  Bojan Cukic and
                  Robin S. Poston and
                  Nuno Laranjeiro},
  title        = {Trap-Based Software Review: How Will Engineers Embed Bugs Due to Cognitive
                  Error?},
  booktitle    = {2018 {IEEE} International Symposium on Software Reliability Engineering
                  Workshops, {ISSRE} Workshops, Memphis, TN, USA, October 15-18, 2018},
  pages        = {6--11},
  publisher    = {{IEEE} Computer Society},
  year         = {2018},
  url          = {https://doi.org/10.1109/ISSREW.2018.00-39},
  doi          = {10.1109/ISSREW.2018.00-39},
  timestamp    = {Wed, 26 Jun 2024 17:26:37 +0200},
  biburl       = {https://dblp.org/rec/conf/issre/UreshinoNYNA18.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}

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