BibTeX record conf/isscc/MeterelliyozGKR10

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@inproceedings{DBLP:conf/isscc/MeterelliyozGKR10,
  author    = {Mesut Meterelliyoz and
               Ashish Goel and
               Jaydeep P. Kulkarni and
               Kaushik Roy},
  title     = {Accurate characterization of random process variations using a robust
               low-voltage high-sensitivity sensor featuring replica-bias circuit},
  booktitle = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
               Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
               2010},
  pages     = {186--187},
  publisher = {{IEEE}},
  year      = {2010},
  url       = {https://doi.org/10.1109/ISSCC.2010.5433991},
  doi       = {10.1109/ISSCC.2010.5433991},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/conf/isscc/MeterelliyozGKR10.bib},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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