BibTeX record conf/isscc/MeterelliyozGKR10

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@inproceedings{DBLP:conf/isscc/MeterelliyozGKR10,
  author    = {Mesut Meterelliyoz and
               Ashish Goel and
               Jaydeep P. Kulkarni and
               Kaushik Roy},
  title     = {Accurate characterization of random process variations using a robust
               low-voltage high-sensitivity sensor featuring replica-bias circuit},
  booktitle = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
               Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
               2010},
  pages     = {186--187},
  year      = {2010},
  crossref  = {DBLP:conf/isscc/2010},
  url       = {https://doi.org/10.1109/ISSCC.2010.5433991},
  doi       = {10.1109/ISSCC.2010.5433991},
  timestamp = {Wed, 17 May 2017 14:25:07 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isscc/MeterelliyozGKR10},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isscc/2010,
  title     = {{IEEE} International Solid-State Circuits Conference, {ISSCC} 2010,
               Digest of Technical Papers, San Francisco, CA, USA, 7-11 February,
               2010},
  publisher = {{IEEE}},
  year      = {2010},
  url       = {http://ieeexplore.ieee.org/xpl/mostRecentIssue.jsp?punumber=5428240},
  isbn      = {978-1-4244-6033-5},
  timestamp = {Tue, 18 Oct 2011 15:16:07 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isscc/2010},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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