BibTeX record conf/isqed/UbarMRJ10

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@inproceedings{DBLP:conf/isqed/UbarMRJ10,
  author       = {Raimund Ubar and
                  Dmitri Mironov and
                  Jaan Raik and
                  Artur Jutman},
  title        = {Structural fault collapsing by superposition of BDDs for test generation
                  in digital circuits},
  booktitle    = {11th International Symposium on Quality of Electronic Design {(ISQED}
                  2010), 22-24 March 2010, San Jose, CA, {USA}},
  pages        = {250--257},
  publisher    = {{IEEE}},
  year         = {2010},
  url          = {https://doi.org/10.1109/ISQED.2010.5450451},
  doi          = {10.1109/ISQED.2010.5450451},
  timestamp    = {Sun, 25 Oct 2020 22:55:58 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/UbarMRJ10.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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