BibTeX record conf/isqed/SomashekarT13

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@inproceedings{DBLP:conf/isqed/SomashekarT13,
  author    = {Ahish Mysore Somashekar and
               Spyros Tragoudas},
  title     = {Diagnosis of small delay defects arising due to manufacturing imperfections
               using path delay measurements},
  booktitle = {International Symposium on Quality Electronic Design, {ISQED} 2013,
               Santa Clara, CA, USA, March 4-6, 2013},
  pages     = {481--486},
  year      = {2013},
  crossref  = {DBLP:conf/isqed/2013},
  url       = {https://doi.org/10.1109/ISQED.2013.6523655},
  doi       = {10.1109/ISQED.2013.6523655},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/SomashekarT13},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
@proceedings{DBLP:conf/isqed/2013,
  title     = {International Symposium on Quality Electronic Design, {ISQED} 2013,
               Santa Clara, CA, USA, March 4-6, 2013},
  publisher = {{IEEE}},
  year      = {2013},
  url       = {https://ieeexplore.ieee.org/xpl/conhome/6520923/proceeding},
  isbn      = {978-1-4673-4951-2},
  timestamp = {Wed, 16 Oct 2019 14:14:55 +0200},
  biburl    = {https://dblp.org/rec/bib/conf/isqed/2013},
  bibsource = {dblp computer science bibliography, https://dblp.org}
}
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