BibTeX record conf/isqed/LiHQZTGB05

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@inproceedings{DBLP:conf/isqed/LiHQZTGB05,
  author       = {Xiaojun Li and
                  Bing Huang and
                  J. Qin and
                  X. Zhang and
                  Michael Talmor and
                  Z. Gur and
                  Joseph B. Bernstein},
  title        = {Deep Submicron {CMOS} Integrated Circuit Reliability Simulation with
                  {SPICE}},
  booktitle    = {6th International Symposium on Quality of Electronic Design {(ISQED}
                  2005), 21-23 March 2005, San Jose, CA, {USA}},
  pages        = {382--389},
  publisher    = {{IEEE} Computer Society},
  year         = {2005},
  url          = {https://doi.org/10.1109/ISQED.2005.37},
  doi          = {10.1109/ISQED.2005.37},
  timestamp    = {Sat, 30 Sep 2023 09:50:44 +0200},
  biburl       = {https://dblp.org/rec/conf/isqed/LiHQZTGB05.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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