BibTeX record conf/isqed/JahinuzzamanSS08

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@inproceedings{DBLP:conf/isqed/JahinuzzamanSS08,
  author       = {Shah M. Jahinuzzaman and
                  Mohammad Sharifkhani and
                  Manoj Sachdev},
  title        = {Investigation of Process Impact on Soft Error Susceptibility of Nanometric
                  SRAMs Using a Compact Critical Charge Model},
  booktitle    = {9th International Symposium on Quality of Electronic Design {(ISQED}
                  2008), 17-19 March 2008, San Jose, CA, {USA}},
  pages        = {207--212},
  publisher    = {{IEEE} Computer Society},
  year         = {2008},
  url          = {https://doi.org/10.1109/ISQED.2008.4479727},
  doi          = {10.1109/ISQED.2008.4479727},
  timestamp    = {Thu, 23 Mar 2023 23:58:32 +0100},
  biburl       = {https://dblp.org/rec/conf/isqed/JahinuzzamanSS08.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}
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